In this paper, formation of defects/defect clusters in nickel nanowires (Ni-NWs) due to interaction of a 60 kilo-electron-volt (keV) beam of proton (H[Formula: see text] ions is studied. Ni-NWs are exposed to various fluencies of H[Formula: see text] ions ranging between [Formula: see text] and [Formula: see text][Formula: see text]ions/cm2. The analysis of pristine and H[Formula: see text] ion-irradiated Ni-NWs samples is mainly done using transmission electron microscopy (TEM) and X-ray diffraction (XRD) techniques. Stopping range of ions in matter (SRIM) simulation software is employed to verify the production of defect clusters in Ni-NWs theoretically. Furthermore, insight of creation of defects in Ni-NWs due to interaction of low energy H[Formula: see text] ions in keV range is made using the theory of collision cascade effect. The study of defect clusters induced in Ni-NWs under H[Formula: see text] ions beam irradiation is essential for application of Ni-NW-based nanodevices in harsh environment containing plenty of H[Formula: see text] ions such as for use in spacecraft equipped for space missions.

中文翻译：

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镍纳米线中缺陷/缺陷簇的形成研究

在本文中，研究了由于 60 千电子伏 (keV) 的质子 (H[公式：见正文] 离子束相互作用而在镍纳米线 (Ni-NWs) 中形成缺陷/缺陷簇。Ni-NWs暴露于各种流态的 H[公式：见正文] 离子，范围介于 [公式：见正文] 和 [公式：见正文][公式：见正文]ions/cm2. 原始和 H[公式：见正文] 离子辐照的 Ni-NWs 样品的分析主要使用透射电子显微镜 (TEM) 和 X 射线衍射 (XRD) 技术进行。采用物质中离子停止范围（SRIM）模拟软件从理论上验证了Ni-NWs中缺陷簇的产生。此外，利用碰撞级联效应理论，深入了解由于低能 H[公式：见文本] 离子在 keV 范围内的相互作用而在 Ni-NW 中产生缺陷。H[公式：见文本]离子束辐照下Ni-NWs中诱导的缺陷簇的研究对于Ni-NW基纳米器件在含有大量H[公式：见文本]离子的恶劣环境中的应用至关重要，例如使用在为太空任务配备的航天器中。