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Relationship between wheat root properties and its electrical signature using the spectral induced polarization method
Vadose Zone Journal ( IF 2.8 ) Pub Date : 2020-02-25 , DOI: 10.1002/vzj2.20014
Kuzma Tsukanov 1 , Nimrod Schwartz 1
Affiliation  

Measuring root properties, the “hidden half” of the plant, is challenging due to their heterogeneous and dynamic nature. A promising method for noninvasive mapping of roots and their activity, spectral induced polarization (SIP), has been introduced. However, measurements of root properties together with their SIP responses are missing, limiting the interpretation of a root's SIP signature. In this study, we coupled SIP measurements of roots in hydroponic solution with measurements of root biomass, surface area, and diameter. Furthermore, we monitored the SIP response of roots poisoned by cyanide, which results in depolarization of the root's cell membrane potential. We found a linear correlation between root biomass and surface area, and the low‐frequency electrical polarization. In addition, we demonstrate the relationship between root cell membrane potential and root polarization. Based on the results, we suggest that in comparison with the stem‐based approach used by other researchers, the polarization in the contact‐free method used in this study is related to the external surface area of the root and external architectural structures such as root diameter and root hair. Overall, a direct link between root properties and their electrical signature was established.

中文翻译:

光谱诱导极化法研究小麦根系特性与其电信号的关系

根系特性(植物的“隐藏部分”)的测量具有异质性和动态性,因此具有挑战性。引入了一种有前途的无创性绘制根及其活动图的方法,即光谱诱导极化(SIP)。但是,缺少对根属性及其SIP响应的测量,从而限制了对根SIP签名的解释。在这项研究中,我们将水培溶液中根的SIP测量与根生物量,表面积和直径的测量耦合在一起。此外,我们监测了被氰化物中毒的根的SIP反应,这导致根的细胞膜电位去极化。我们发现根生物量和表面积与低频电极化之间存在线性关系。此外,我们证明了根细胞膜电位与根极化之间的关系。根据结果​​,我们建议与其他研究人员使用的基于茎的方法相比,本研究中使用的无接触方法中的极化与根的外表面积和外部建筑结构(例如根)有关直径和根毛。总体而言,根系特性与其电气签名之间建立了直接联系。
更新日期:2020-02-25
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