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Rapid detection of inclusion particles in recycled aluminum materials by laser-induced plasma optical emission spectrometry with scanning laser beam
Surfaces and Interfaces ( IF 6.2 ) Pub Date : 2020-09-01 , DOI: 10.1016/j.surfin.2020.100602
Yusuke Fugane , Shunsuke Kashiwakura , Kazuaki Wagatsuma

Abstract This paper describes an analytical method to evaluate the kind and the number of inclusion particles on the surface of a recycled Al ingot using laser-induced breakdown spectrometry (LIBS) with scanning laser beam. The surface was observed with scanning electron microscope - energy dispersive X-ray spectrometry (SEM-EDX) as well as scanning LIBS in the same viewing positions, in which inclusion particles of Si and Fe compounds were found. By measuring the emission intensity of the Fe I 358.119-nm and Si I 288.160-nm lines, the lateral distribution of Si and Fe inclusion particles was estimated from 2D intensity maps of these emission lines. The lateral resolution of the scanning LIBS was about 100 μm, which was restricted by the size of an ablated crater and the surrounding area; therefore, it is difficult to evaluate the actual number of fine inclusion particles (one or more particles may be counted to be a single particle). Nevertheless, the scanning LIBS has an advantage that the analysis can be conducted easily and rapidly compared to conventional analytical methods for inclusions. In our LIBS apparatus, the analysis for a sample surface of 4.0 × 5.0 mm2 was finished in about 40 min. and the time would be reduced if the spectrum analysis is automated on a computer. Accordingly, it is expected that the scanning LIBS can be utilized to consult on the quality of recycled Al materials in the recycling sites.

中文翻译:

扫描激光束激光诱导等离子体发射光谱法快速检测再生铝材料中的夹杂物颗粒

摘要 本文描述了一种使用激光诱导击穿光谱 (LIBS) 扫描激光束评估再生铝锭表面夹杂物颗粒种类和数量的分析方法。用扫描电子显微镜-能量色散X射线光谱法(SEM-EDX)以及扫描LIBS在相同的观察位置观察表面,其中发现了Si和Fe化合物的夹杂物颗粒。通过测量 Fe I 358.119-nm 和 Si I 288.160-nm 线的发射强度,从这些发射线的二维强度图中估算了 Si 和 Fe 夹杂物颗粒的横向分布。扫描LIBS的横向分辨率约为100 μm,受烧蚀坑及周边区域大小的限制;所以,很难评估细小夹杂物颗粒的实际数量(一个或多个颗粒可能被算作一个颗粒)。尽管如此,与传统的夹杂物分析方法相比,扫描 LIBS 的优点是可以轻松快速地进行分析。在我们的 LIBS 设备中,4.0 × 5.0 mm2 样品表面的分析在大约 40 分钟内完成。如果频谱分析在计算机上自动化,时间会减少。因此,预计可以利用扫描 LIBS 来咨询回收站中回收铝材料的质量。与传统的夹杂物分析方法相比,扫描 LIBS 的优点是可以轻松快速地进行分析。在我们的 LIBS 设备中,4.0 × 5.0 mm2 样品表面的分析在大约 40 分钟内完成。如果频谱分析在计算机上自动化,时间会减少。因此,预计可以利用扫描 LIBS 来咨询回收站中回收铝材料的质量。与传统的夹杂物分析方法相比,扫描 LIBS 的优点是可以轻松快速地进行分析。在我们的 LIBS 设备中,4.0 × 5.0 mm2 样品表面的分析在大约 40 分钟内完成。如果频谱分析在计算机上自动化,时间会减少。因此,预计可以利用扫描 LIBS 来咨询回收站中回收铝材料的质量。
更新日期:2020-09-01
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