In this work, a new method to determine and correct the linear drift for any crystalline orientation in a single-column-resolved high-resolution scanning transmission electron microscopy (HR-STEM) image, which is based on angle measurements in the Fourier space, is presented. This proposal supposes a generalization and the improvement of a previous work that needs the presence of two symmetrical planes in the crystalline orientation to be applicable. Now, a mathematical derivation of the drift effect on two families of asymmetric planes in the reciprocal space is inferred. However, though it was not possible to find an analytical solution for all conditions, a simple formula was derived to calculate the drift effect that is exact for three specific rotation angles. Taking this into account, an iterative algorithm based on successive rotation/drift correction steps is devised to remove drift distortions in HR-STEM images. The procedure has been evaluated using a simulated micrograph of a monoclinic material in an orientation where all the reciprocal lattice vectors are different. The algorithm only needs four iterations to resolve a 15° drift angle in the image.

中文翻译：

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CDrift：从单个高分辨率 STEM 图像中校正线性漂移的算法

在这项工作中，基于傅立叶空间中的角度测量，在单柱分辨高分辨率扫描透射电子显微镜 (HR-STEM) 图像中确定和校正任何晶体取向的线性漂移的新方法，被表达。该建议假设对先前工作的概括和改进，该工作需要在晶体取向中存在两个对称平面才能适用。现在，对互易空间中的两个非对称平面族的漂移效应进行数学推导。然而，虽然不可能找到所有条件的解析解，但推导出了一个简单的公式来计算三个特定旋转角度的精确漂移效应。考虑到这一点，设计了一种基于连续旋转/漂移校正步骤的迭代算法来消除 HR-STEM 图像中的漂移失真。已使用单斜晶材料在所有倒易晶格向量都不同的方向上的模拟显微照片评估了该过程。该算法只需要四次迭代即可解决图像中的 15° 漂移角。