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Structural properties, thicknesses, and qualities of plutonium oxide thin films prepared by polymer assisted deposition
Surface Science ( IF 2.1 ) Pub Date : 2020-11-01 , DOI: 10.1016/j.susc.2020.121696
Marianne P. Wilkerson , Jacquelyn M. Dorhout , Kevin S. Graham , John J. Joyce , Izabela I. Kruk , Jaroslaw Majewski , Daniel T. Olive , Alison L. Pugmire , Brian L. Scott , Jared T. Stritzinger , Gregory L. Wagner , Erik B. Watkins , Laura E. Wolfsberg

Abstract Phase purity, morphology, and defect structures on plutonium oxide surfaces likely influence reactivity of plutonium, and high quality PuO2 crystalline substrates are needed to probe the effects of these properties on a model plutonium oxide surface. Indeed, different thin film thicknesses are required for conducting the range of state-of-the-art measurements available for studying these surfaces. In this Article, modification of a polymer-assisted deposition method is employed to grow various film thicknesses of PuO2 on yttria stabilized zirconia (YSZ) substrates, and measurements are carried out to characterize these films. Phase purity and epitaxial qualities of the films are assessed using thin film X-ray diffraction analysis, and the first Grazing Incidence Extended X-ray Absorption Fine Structure measurements carried out on a PuO2 thin film are reported, providing information about the short-range order of the lattice structure. Elemental purity is measured via X-ray photoelectron spectroscopy. Thicknesses and densities of the films are evaluated using neutron reflectivity, revealing that phase-pure PuO2 thin films of high epitaxial quality are formed. Micro-Raman spectroscopy suggests development of structural agglomerates of PuO2 on the surfaces, likely resulting from defects in the lattice match between the PuO2 film and the YSZ substrate.

中文翻译:

聚合物辅助沉积制备的氧化钚薄膜的结构特性、厚度和质量

摘要 氧化钚表面的相纯度、形态和缺陷结构可能会影响钚的反应性,需要高质量的 PuO2 晶体基底来探测这些特性对模型氧化钚表面的影响。事实上,需要不同的薄膜厚度来进行可用于研究这些表面的最先进的测量范围。在本文中,采用聚合物辅助沉积方法的改进在氧化钇稳定的氧化锆 (YSZ) 基板上生长各种厚度的 PuO2,并进行测量以表征这些薄膜。使用薄膜 X 射线衍射分析评估薄膜的相纯度和外延质量,并报告了对 PuO2 薄膜进行的首次掠入射扩展 X 射线吸收精细结构测量,提供了有关晶格结构短程有序的信息。通过 X 射线光电子能谱测量元素纯度。使用中子反射率评估薄膜的厚度和密度,表明形成了高外延质量的纯相 PuO2 薄膜。微拉曼光谱表明在表面上形成了 PuO2 的结构团聚体,这可能是由 PuO2 薄膜和 YSZ 基板之间的晶格匹配缺陷造成的。使用中子反射率评估薄膜的厚度和密度,表明形成了高外延质量的纯相 PuO2 薄膜。微拉曼光谱表明在表面上形成了 PuO2 的结构团聚体,这可能是由 PuO2 薄膜和 YSZ 基板之间的晶格匹配缺陷造成的。使用中子反射率评估薄膜的厚度和密度,表明形成了高外延质量的纯相 PuO2 薄膜。微拉曼光谱表明在表面上形成了 PuO2 的结构团聚体,这可能是由 PuO2 薄膜和 YSZ 基板之间的晶格匹配缺陷造成的。
更新日期:2020-11-01
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