The intensity of the analytical ClKα‐line continuously increases during the measurement of a rock sample. The main cause of this effect is the migration of chlorine into the irradiated (emitting) part of the sample. The hypothesis was credibly proved through the experiment in which a rock sample was measured first on one side, and then on the other. An increase in the intensity of the analytical line was observed in both measurements. The intensity in the second measurement registers an increase from the same or even the lower level than in the first part. The following chlorine migration model is proposed. Negative chlorine ions arise in the rock sample under the influence of primary X‐ray radiation. X‐ray photons knock out part of the ions from the sample; therefore, a positive electric field is formed in it at the sample–vacuum interface. It attracts chlorine ions from the depths of the sample, as well as chlorine ions flying outside. Thus, the number of chlorine atoms in the surface layer of the sample increases and consequently, the intensity of the analytical line of chlorine increases. Formation of chlorine ions, their migration, and concentration in the surface layer of the sample occur only under the influence of primary X‐ray radiation.

中文翻译：

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岩石X射线荧光分析中氯的迁移

分析Cl K的强度在测量岩石样品期间，α线不断增加。造成这种影响的主要原因是氯迁移到样品的辐射（发射）部分。该假设通过实验得到了可靠的证明，在该实验中，首先在一侧测量岩石样品，然后在另一侧测量岩石样品。在两次测量中均观察到分析线强度的增加。第二个测量中的强度与第一个部分中的强度相同或什至更低。提出了以下氯迁移模型。在一次X射线辐射的影响下，岩石样品中会产生负氯离子。X射线光子从样品中剔除部分离子；因此，在样品-真空界面上会形成一个正电场。它从样品的深处吸引氯离子，并且氯离子飞到外面。因此，样品表面层中的氯原子数增加，因此，氯的分析线的强度增加。氯离子的形成，它们的迁移以及在样品表层的浓度仅在一次X射线辐射的影响下发生。