Abstract The formation of a faulted dipole shaped like a letter Z (Z-shape) and a microcrack shaped like a letter S (S-shape) was investigated in (Cd, Mn) Te single crystal by transmission electron microscopy. Dislocations around the microcrack were determined as perfect dislocations and Shockley partial dislocations (partials) by different two-beam conditions. The nipped stair rod dislocation was produced by the interaction of two partials lying on mutually inclined {1 1 1} planes. The faulted dipole was generated by two partials moving toward the opposite directions on parallel {1 1 1} planes. Owing to the locking effect of Z-shape faulted dipole, the S-shape microcrack occurred along [1 1 1 ¯ ] direction.

中文翻译：

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(Cd, Mn) Te晶体微裂纹形成的位错反应机理

摘要 通过透射电子显微镜研究了(Cd, Mn) Te 单晶中Z 形断层偶极子(Z 形)和S 形微裂纹的形成。通过不同的两束条件，微裂纹周围的位错被确定为完美位错和肖克利部分位错（部分）。夹住的楼梯杆位错是由位于相互倾斜的 {1 1 1} 平面上的两个部分相互作用产生的。断层偶极子是由在平行 {1 1 1} 平面上向相反方向移动的两个部分产生的。由于Z形断层偶极子的锁定作用，S形微裂纹沿[1 1 1¯]方向发生。