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Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout System
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2020-07-14 , DOI: 10.1017/s1431927620001762 Yin Min Goh 1 , Jonathan Schwartz 2 , Emily Rennich 3 , Tao Ma 4 , Bobby Kerns 5 , Robert Hovden 2, 5
中文翻译：
使用开放式硬件、高真空烘烤系统量化和减轻 TEM 支架的污染
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2020-07-14 , DOI: 10.1017/s1431927620001762 Yin Min Goh 1 , Jonathan Schwartz 2 , Emily Rennich 3 , Tao Ma 4 , Bobby Kerns 5 , Robert Hovden 2, 5
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中文翻译：
使用开放式硬件、高真空烘烤系统量化和减轻 TEM 支架的污染
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