High Resolution Particle Induced X-ray Emission, for short HR-PIXE, dates back to 1977 and is, therefore, nearly as old as standard PIXE itself. Until roughly ten years ago, High Resolution PIXE (HR-PIXE) work used only wavelength dispersive spectrometers (WDS). The installation, in 2008, of an X-ray Microcalorimeter Spectrometer, XMS at CTN (ITN at the time) 3MV tandetron, altered this situation and, as can be recognised today, will lead to major changes in PIXE, and open up many possibilities that have been hindered so far. In this work, motives, developments, important breakthrough results obtained until now, and a case study displaying speciation data and complementary information from nuclear magnetic relaxometry, are presented and discussed, showing the full quantitative potential of High Resolution Energy Dispersion PIXE (HiRED-PIXE), in particularly the opening up of the possibility to establish fast and efficient methods for quantitative elemental speciation in unknown samples.

简称HR-PIXE的高分辨率粒子诱导X射线发射可追溯到1977年，因此其寿命几乎与标准PIXE本身一样。直到大约十年前，高分辨率PIXE（HR-PIXE）的工作仅使用波长色散光谱仪（WDS）。2008年在CTN（当时为ITN）3MV tandetron的XMS X射线量热仪的安装，改变了这种状况，并且今天已经认识到，它将导致PIXE的重大变化，并开辟了许多可能性到目前为止受到阻碍。在这项工作中，提出并讨论了到目前为止所取得的动机，发展，重要的突破性结果，以及展示形态数据和来自核磁弛豫的补充信息的案例研究，显示了高分辨率能量色散PIXE（HiRED-PIXE）的全部定量潜力），