In this work, a series of tellurite glass combined with various concentrations of germanium oxide was fabricated according to the formula of (70-x)TeO₂-xGeO₂–20ZnO-10Li₂O where x = 5, 10, 15 and 20 mol% via utilizing the melt-quench method for possible use in a radiation shielding applications. X-ray diffraction and Attenuated Total Reflectance Fourier Transform Infrared was employed to investigate the structure of the synthesized glasses. The density and Poisson's ratio for current samples reduced gradually from 5.221–5.008 g.cm⁻³ and 0.134–0.131, respectively, while the enhancement in bandgap values from 3.700–3.872 eV with addition of GeO₂ is observed. The linear attenuation coefficient values at 0.015 MeV are 230.123 and 236.832 cm⁻¹ for samples TG1 and TG4, respectively. Moreover, the lowest half-value layer attained via TG1 and raises from 0.0030 to 3.6684 cm while the highest HVL attained by TG4 and raises from 0.0029 to 3.9696 cm.

在这项工作中，根据（70-x）TeO ₂ -xGeO ₂ –20ZnO-10Li ₂ O的公式制造了一系列结合各种浓度氧化锗的碲酸盐玻璃，其中x  = 5、10、15和20 mol通过利用熔体猝灭法可用于辐射屏蔽应用中的％。利用X射线衍射和衰减全反射傅立叶变换红外光谱对合成玻璃的结构进行了研究。当前样品的密度和泊松比分别从5.221–5.008 g.cm ^-3和0.134–0.131逐渐降低，而添加GeO _2的带隙值从3.700–3.872 eV增强被观察到。对于样品TG1和TG4，在0.015MeV处的线性衰减系数值分别为230.123和236.832cm ^-1。此外，通过TG1达到的最低半值层从0.0030升高到3.6684 cm，而通过TG4达到的最高半值层从0.0029升高到3.9696 cm。