Abstract In this report, we show that hyperspectral high-resolution photoluminescence mapping is a powerful tool for the selection and optimization of the laser ablation processes used for the patterning interconnections of subcells on Cu(Inx,Ga1−x)Se2 (CIGS) modules. In this way, we show that in-depth monitoring of material degradation in the vicinity of the ablation region and the identification of the underlying mechanisms can be accomplished. Specifically, by analyzing the standard P1 patterning line ablated before the CIGS deposition, we reveal an anomalous emission-quenching effect that follows the edge of the molybdenum groove underneath. We further rationalize the origins of this effect by comparing the topography of the P1 edge through a scanning electron microscope (SEM) cross-section, where a reduction of the photoemission cannot be explained by a thickness variation. We also investigate the laser-induced damage on P1 patterning lines performed after the deposition of CIGS. We then document, for the first time, the existence of a short-range damaged area, which is independent of the application of an optical aperture on the laser path. Our findings pave the way for a better understanding of P1-induced power losses and introduce new insights into the improvement of current strategies for industry-relevant module interconnection schemes.

中文翻译：

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通过高光谱发光破译 CIGS 模块中 P1 引起的功率损耗的起源

摘要 在本报告中，我们展示了高光谱高分辨率光致发光映射是选择和优化用于 Cu(Inx,Ga1-x)Se2 (CIGS) 模块上子电池图案互连的激光烧蚀工艺的强大工具。通过这种方式，我们表明可以实现对消融区域附近材料降解的深入监测和潜在机制的识别。具体来说，通过分析在 CIGS 沉积之前烧蚀的标准 P1 图案线，我们揭示了跟随下方钼槽边缘的异常发射淬火效应。我们通过扫描电子显微镜 (SEM) 横截面比较 P1 边缘的形貌，进一步合理化了这种效应的起源，其中光发射的减少不能用厚度变化来解释。我们还研究了在 CIGS 沉积后对 P1 图案线进行的激光诱导损伤。然后我们首次记录了短程损坏区域的存在，该区域与激光路径上的光学孔径的应用无关。我们的发现为更好地理解 P1 引起的功率损耗铺平了道路，并为改进行业相关模块互连方案的当前策略提供了新的见解。这与激光路径上的光学孔径的应用无关。我们的发现为更好地理解 P1 引起的功率损耗铺平了道路，并为改进行业相关模块互连方案的当前策略提供了新的见解。这与激光路径上的光学孔径的应用无关。我们的发现为更好地理解 P1 引起的功率损耗铺平了道路，并为改进行业相关模块互连方案的当前策略提供了新的见解。