We present a simplified Nicolson–Ross–Weir (NRW) material characterization procedure that employs only a single-port network analyzer for data collection. This approach is particularly attractive for mmW and THz applications, as it eliminates the need for costly two-port instrumentation required in the conventional NRW method. Akin to the well-known adapter removal techniques, we use two successive calibrations of the defined measurement ports and deduce the two-port response of the sample under test. Subsequently, the conventional NRW procedure can be employed to simultaneously determine permittivity and permeability of the material under test. We demonstrate our approach for the WR8.0 waveguide band (90–140 GHz) using a multioffset-short calibration method. Similar to the two-port through–reflect–line calibration, the multioffset-short process determines the propagation constant of the waveguide, which provides additional verification of the quality of the collected measurements and the validity of the NRW procedure. We demonstrate that the simplified one-port NRW method is as effective in performance as the conventional two-port procedure. To our knowledge, this is the first-time realization of the single-port NRW method for mmW and THz bands.

中文翻译：

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使用单端口测量进行材料表征的简化 Nicolson-Ross-Weir 方法

我们提出了一个简化的 Nicolson-Ross-Weir (NRW) 材料表征程序，该程序仅使用单端口网络分析仪进行数据收集。这种方法对于 mmW 和 THz 应用特别有吸引力，因为它不需要传统 NRW 方法所需的昂贵的双端口仪器。类似于众所周知的适配器移除技术，我们使用定义的测量端口的两次连续校准并推导出被测样品的双端口响应。随后，可以使用传统的 NRW 程序同时确定被测材料的介电常数和磁导率。我们使用多偏移距短校准方法展示了我们针对 WR8.0 波导频段 (90–140 GHz) 的方法。类似于两端口通过反射线校准，multioffset-short 过程决定了波导的传播常数，这为收集的测量结果的质量和 NRW 程序的有效性提供了额外的验证。我们证明了简化的单端口 NRW 方法在性能上与传统的双端口程序一样有效。据我们所知，这是第一次实现毫米波和太赫兹频段的单端口 NRW 方法。