Pair distribution functions obtained from total scattering measurements enables quantifying the local, intermediate, and long‐range structure of materials, even in the absence of well‐ordered crystals. The methodology can bridge the experimental gap between local atomic environments (such as from spectroscopic methods) and domain microstructure (such as from microscopy), to help give a more detailed understanding of relationships between processing, structures, and properties in the “as‐produced” and industrial polymer materials. Maxwell W. Terban and colleagues provide more details in their article on page 1843. (DOI: 10.1002/pol.20190272)

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封面图片，第58卷，第13期

通过总散射测量获得的成对分布函数，即使在没有规则晶体的情况下，也可以量化材料的局部，中间和远距离结构。该方法可以弥合局部原子环境（例如来自光谱方法）和域微观结构（例如来自显微镜）之间的实验差距，以帮助更详细地了解“成品”中的工艺，结构和性质之间的关系。和工业高分子材料。Maxwell W.Terban及其同事在其第1843页的文章中提供了更多详细信息。（DOI：10.1002 / pol.20190272）