In order to address the complexity of chemical analysis of biological systems, time-of-flight secondary ion mass spectrometry (ToF-SIMS), x-ray photoelectron spectroscopy (XPS), and x-ray photoemission electron microscopy (XPEEM) were used for combined surface imaging of a biological tissue formed around a surface neural device after implantation on a nonhuman primate brain. Results show patterns on biological tissue based on extracellular matrix (ECM) and phospholipid membrane (PM) molecular fragments, which were contrasted through principal component analysis of ToF-SIMS negative spectrum. This chemical differentiation may indicate severe inflammation on tissue with an early case of necrosis. Quantification of the elemental composition and the chemical bonding states on both ECM-rich and PM-rich features was possible through XPS analysis from survey and high-resolution spectra, respectively. Variable amounts of carbon (68%–80.5%), nitrogen (10%–2.4%), and oxygen (20.8%–16.5%) were detected on the surface of the biological tissue. Chlorine, phosphorous sodium, and sulfur were also identified in lower extends. Besides that, analysis of the C 1s high-resolution spectra for the same two regions (ECM and PM ones) showed that a compromise between C—C (41.8 at. %) and C—N/C—O (35.6 at. %) amounts may indicate a strong presence of amino acids and proteoglycans on the ECM fragment-rich region, while the great amount of C—C (70.1 at. %) on the PM fragment-rich region is attributed to the large chains of fatty acids connected to phospholipid molecules. The micrometer-scale imaging of these chemical states on tissue was accomplished through XPEEM analysis. The C—C presence was found uniformly distributed across the entire analyzed area, while C—N/C—O and C=O were in two distinct regions. The combination of ToF-SIMS, XPS, and XPEEM is shown here as a powerful, noninvasive approach to map out elemental and chemical properties of biological tissues, i.e., identification of chemically distinct regions, followed by quantification of the surface chemical composition in each distinct region.

中文翻译：

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结合表面敏感的显微镜检查，以分析神经装置植入后的生物组织。

为了解决生物系统化学分析的复杂性，飞行时间二次离子质谱（ToF-SIMS），X射线光电子能谱（XPS）和X射线光发射电子显微镜（XPEEM）被用于植入非人类灵长类动物大脑后在表面神经装置周围形成的生物组织的组合表面成像。结果显示，基于细胞外基质（ECM）和磷脂膜（PM）分子片段的生物组织上的模式，通过ToF-SIMS负光谱的主成分分析进行了对比。这种化学分化可能表明组织发生严重炎症，并伴有早期坏死。分别通过调查和高分辨率光谱的XPS分析，可以对富ECM和富PM的元素的元素组成和化学键态进行定量分析。在生物组织的表面检测到各种数量的碳（68％–80.5％），氮（10％–2.4％）和氧（20.8％–16.5％）。氯，磷钠和硫的含量也较低。除此之外，对相同两个区域（ECM和PM区域）的C 1s高分辨率光谱分析表明，CC（41.8 at。％）和C-N / C-O（35.6 at。％）之间存在折衷）的量可能表明在富含ECM片段的区域中氨基酸和蛋白聚糖的存在很强，而大量的CC（70.1 at。富含PM片段的区域中的％）归因于与磷脂分子连接的脂肪酸大链。这些化学状态在组织上的微米级成像是通过XPEEM分析完成的。发现CC存在均匀分布在整个分析区域，而C / N和C = O位于两个不同的区域。ToF-SIMS，XPS和XPEEM的组合在此处显示为一种强大的，非侵入性的方法，可绘制出生物组织的元素和化学特性，即识别化学上不同的区域，然后对每个不同的表面中的化学成分进行定量地区。而C-N / C-O和C = O位于两个不同的区域。ToF-SIMS，XPS和XPEEM的组合在此处显示为一种强大的，非侵入性的方法，可绘制出生物组织的元素和化学特性，即识别化学上不同的区域，然后对每个不同的表面中的化学成分进行定量地区。而C-N / C-O和C = O位于两个不同的区域。ToF-SIMS，XPS和XPEEM的组合在此处显示为一种强大的，非侵入性的方法，可绘制出生物组织的元素和化学特性，即识别化学上不同的区域，然后对每个不同的表面中的化学成分进行定量地区。