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Tapered image charge detector for measuring velocity distributions of submicrometer particle scattering
Review of Scientific Instruments ( IF 1.3 ) Pub Date : 2020-06-01 , DOI: 10.1063/1.5142207
Morgan E C Miller 1 , Michelle Mezher 2 , Robert E Continetti 2
Affiliation  

A novel detector for measuring the post-impact velocities (trajectory and speed) of charged submicrometer particles is presented. A stack of tapered cylindrically symmetric electrodes connected to a set of image charge detection circuits is used in conjunction with an image-charge-sensitive target to measure the incident velocity and scattered trajectories of charged particles following impact with the target. This particle detector is used in conjunction with a mass, charge, and energy-selected source of collimated charged particles. Polystyrene latex spheres were used to characterize the performance of the detector, and examples of scattering trajectories are analyzed to demonstrate detector functionality. Measurements of the coefficient of restitution for 500 nm diameter tin particles are also reported and compared with previous measurements performed with a simpler image-charge detector. Finally, the angular distribution for 500 nm tin particles scattering from highly polished molybdenum at an incident velocity of 150 m/s is reported.

中文翻译:

用于测量亚微米粒子散射速度分布的锥形图像电荷检测器

提出了一种用于测量带电亚微米粒子撞击后速度(轨迹和速度)的新型探测器。一组连接到一组图像电荷检测电路的锥形圆柱对称电极与图像电荷敏感目标结合使用,以测量带电粒子撞击目标后的入射速度和散射轨迹。该粒子探测器与质量、电荷和能量选择的准直带电粒子源结合使用。聚苯乙烯乳胶球用于表征检测器的性能,并分析散射轨迹示例以证明检测器功能。还报告了对直径为 500 nm 的锡颗粒的恢复系数的测量,并与以前使用更简单的图像电荷检测器进行的测量进行了比较。最后,报告了以 150 m/s 的入射速度从高度抛光的钼散射的 500 nm 锡颗粒的角分布。
更新日期:2020-06-01
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