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Impact of fluorine doping on solution-processed In–Ga–Zn–O thin-film transistors using an efficient aqueous route
Aip Advances ( IF 1.4 ) Pub Date : 2020-06-01 , DOI: 10.1063/5.0003855
Masashi Miyakawa 1, 2 , Mitsuru Nakata 1 , Hiroshi Tsuji 1 , Hiroaki Iino 2 , Yoshihide Fujisaki 1
Affiliation  

Simple and facile solution-processed thin-film transistors (TFTs) using metal-oxide semiconductors are promising for producing large-area electronics. To achieve a high-performance solution-processed metal-oxide TFT at a low processing temperature, simple fluorine doping was performed for obtaining a solution-processed metal-oxide semiconductor through efficient metal aqua complexation. The TFTs fabricated using conventional IGZO and fluorine-doped IGZO (IGZO:F) precursors were evaluated. The IGZO:F fabricated TFT demonstrated higher mobility, better switching characteristics, and enhanced overall TFT performance. This simple, low-temperature fluorine doping technique improved the solution-processed TFT for future scalable and low-cost TFTs.

中文翻译:

氟掺杂对溶液处理的In-Ga-Zn-O薄膜晶体管的影响

使用金属氧化物半导体的简单而简便的溶液处理薄膜晶体管(TFT)有望用于生产大面积电子产品。为了在低处理温度下获得高性能的溶液处理的金属氧化物TFT,进行了简单的氟掺杂,以通过有效的金属水络合获得溶液处理的金属氧化物半导体。评估了使用常规IGZO和掺氟IGZO(IGZO:F)前驱体制造的TFT。IGZO:F制成的TFT表现出更高的迁移率,更好的开关特性和增强的TFT性能。这种简单的低温氟掺杂技术改进了溶液处理的TFT,可用于将来的可扩展且低成本的TFT。
更新日期:2020-06-30
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