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High-Resolution Interferometric Synthetic Aperture Imaging in Scattering Media
SIAM Journal on Imaging Sciences ( IF 2.1 ) Pub Date : 2020-02-25 , DOI: 10.1137/19m1272470
Liliana Borcea , Josselin Garnier

SIAM Journal on Imaging Sciences, Volume 13, Issue 1, Page 291-316, January 2020.
The goal of synthetic aperture imaging is to estimate the reflectivity of a remote region of interest by processing data gathered with a moving sensor which emits periodically a signal and records the backscattered wave. We introduce and analyze a high-resolution interferometric method for synthetic aperture imaging through an unknown scattering medium which distorts the wave. The method builds on the coherent interferometric approach which uses empirical cross-correlations of the measurements to mitigate the distortion, at the expense of a loss of resolution of the image. The new method shows that, while mitigating the wave distortion, it is possible to obtain a robust and sharp estimate of the modulus of the Fourier transform of the reflectivity function. A high-resolution image can then be obtained by a phase retrieval algorithm.


中文翻译:

散射介质中的高分辨率干涉合成孔径成像

SIAM影像科学杂志,第13卷,第1期,第291-316页,2020年1月。
合成孔径成像的目的是通过处理用移动传感器收集的数据来估计感兴趣的远程区域的反射率,该传感器周期性地发射信号并记录反向散射波。我们介绍并分析了通过未知散射介质使波失真的合成孔径成像的高分辨率干涉仪方法。该方法建立在相干干涉测量方法的基础上,该方法使用测量值的经验互相关来减轻失真,但会损失图像分辨率。新方法表明,在减轻波畸变的同时,可以对反射率函数的傅立叶变换的模量进行稳健而清晰的估计。然后可以通过相位检索算法获得高分辨率图像。
更新日期:2020-02-25
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