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Combining IR and X‐ray microtomography data sets: Application to Itokawa particles and to Paris meteorite
Meteoritics and Planetary Science ( IF 2.2 ) Pub Date : 2020-06-29 , DOI: 10.1111/maps.13538
Zelia Dionnet 1, 2 , Rosario Brunetto 3 , Alice Aléon‐Toppani 3 , Stefano Rubino 3, 4 , Donia Baklouti 3 , Ferenc Borondics 4 , Anne‐Cécile Buellet 5 , Zahia Djouadi 3 , Andrew King 4 , Tomoki Nakamura 6 , Alessandra Rotundi 1, 2 , Christophe Sandt 4 , David Troadec 7 , Akira Tsuchiyama 8, 9
Affiliation  

In the near future, a new generation of sample return missions (Hayabusa2, OSIRIS‐REx, MMX, etc.) will collect samples from small solar system bodies. To maximize the scientific outcome of laboratory studies and minimize the loss of precious extraterrestrial samples, an analytical sequence from less destructive to more destructive techniques needs to be established. In this work, we present a combined X‐ray and IR microtomography applied to five Itokawa particles and one fragment of the primitive carbonaceous chondrite Paris. We show that this analytical approach is able to provide a 3‐D physical and chemical characterization of individual extraterrestrial particles, using the measurement of their 3‐D structure and porosity, and the detection of mineral and organic phases, and their spatial co‐localization in 3‐D. We propose these techniques as an efficient first step in a multitechnique analytical sequence on microscopic samples collected by space missions.

中文翻译:

结合IR和X射线显微断层照相术数据集:应用于Itokawa颗粒和巴黎陨石

在不久的将来,新一代的样本返回任务(Hayabusa2,OSIRIS-REx,MMX等)将从小型太阳系物体中收集样本。为了最大限度地提高实验室研究的科学成果并最大程度地减少珍贵的地球外样本的损失,需要建立从破坏性较小到破坏性较大的技术的分析序列。在这项工作中,我们介绍了将X射线和IR显微断层照相术应用于五个Itokawa粒子和原始碳质球粒陨石Paris的一个片段的方法。我们表明,这种分析方法能够通过测量3D结构和孔隙度,检测矿物和有机相以及它们的空间共定位来提供单个外星粒子的3D物理和化学特征在3D中
更新日期:2020-06-29
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