Abstract Fringe projection profilometry (FPP) using a vertical scanning setup has the merit of avoiding occlusions and shadows over triangulation based approaches. However, very few methods with a vertical scanning setup has revealed the supporting physical model to explicate the relationship between depth and the level of defocus of fringe patterns. In this paper, we propose a novel active shape from projection defocus profilometry (ASPDP) method that reconstructs the 3D shape by directly quantifying the physical depth-defocus relationship of squared binary structures. To the best of our knowledge, this is the first ever method that explicitly reveals the physical model relating the shape and the level of defocus of active fringe projection. Experiments show that the proposed ASPDP method can achieve an accuracy up to 14 µm.

中文翻译：

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投影散焦轮廓测量的主动形状

摘要 使用垂直扫描设置的边缘投影轮廓测量法 (FPP) 具有避免基于三角测量方法的遮挡和阴影的优点。然而，很少有垂直扫描设置的方法揭示了支持的物理模型来解释深度和条纹图案散焦水平之间的关系。在本文中，我们提出了一种新的投影散焦轮廓测量法 (ASPDP) 的主动形状​​，该方法通过直接量化平方二元结构的物理深度-散焦关系来重建 3D 形状。据我们所知，这是第一个明确揭示与主动条纹投影的形状和散焦水平相关的物理模型的方法。实验表明，所提出的 ASPDP 方法可以达到高达 14 µm 的精度。