Abstract Multiferroic properties of Bi0.95R0.05FeO3 films (R = La, Pr, Nd, Sm, and Ho) (BRFO) on glass substrates at reduced formation temperature of 450 °C via pulsed laser deposition have been investigated. XRD result shows that perovskite phase is found for all studied BRFO films, but an additional phase, Bi2Fe4O9, coexists for Ho-doped BFO film. For all BRFO films, a fine microstructure with a flat surface is observed. The studied BRFO polycrystalline films exhibit coexistence of good ferroelectric and ferromagnetic properties. The remanent polarization (2Pr) of 57–113 μC/cm2 and electrical coercive field of 210–384 kV/cm is obtained, while the saturation magnetization (Ms) of 6.6–20.3 emu/cm3 and coercivity of 400–600 Oe is attained. The relationship between 2Pr and the ionic radius of R3+ for the BRFO films indicates that R3+ ionic radius may mainly dominate the polarization of BRFO films. The change of Ms with R is related to the magnetic moment of the doped R3+ ion. Besides, the leakage mechanism of BRFO films with R is also discussed. The result in this study suggests multiferroic properties of Bi0.95R0.05FeO3 polycrystalline films could be well tuned by R.

中文翻译：

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玻璃基板上 Bi0.95R0.05FeO3 多晶薄膜的多铁性（R = La、Pr、Nd、Sm 和 Ho）

摘要 研究了通过脉冲激光沉积在 450 °C 的降低形成温度下玻璃基板上 Bi0.95R0.05FeO3 薄膜（R = La、Pr、Nd、Sm 和 Ho）（BRFO）的多铁性。XRD 结果表明，所有研究的 BRFO 薄膜都发现钙钛矿相，但 Ho 掺杂的 BFO 薄膜共存了一个额外的相 Bi2Fe4O9。对于所有 BRFO 薄膜，观察到具有平坦表面的精细微观结构。研究的 BRFO 多晶薄膜表现出良好的铁电和铁磁性能的共存。获得了 57-113 μC/cm2 的剩余极化 (2Pr) 和 210-384 kV/cm 的矫顽力场，同时获得了 6.6-20.3 emu/cm3 的饱和磁化强度 (Ms) 和 400-600 Oe 的矫顽力. BRFO 薄膜的 2Pr 与 R3+ 的离子半径之间的关系表明 R3+ 离子半径可能主要支配 BRFO 薄膜的极化。Ms随R的变化与掺杂的R3+离子的磁矩有关。此外，还讨论了含 R 的 BRFO 薄膜的泄漏机制。本研究的结果表明，Bi0.95R0.05FeO3 多晶薄膜的多铁性可以通过 R 很好地调节。