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Revealing Nanoscale Domains in Cu2ZnSnS4 Thin Films by Catalyzed Chemical Etching
Physica Status Solidi-Rapid Research Letters ( IF 2.5 ) Pub Date : 2020-06-26 , DOI: 10.1002/pssr.202000283 Chaowei Xue 1 , Jialiang Huang 1 , Kaiwen Sun 1 , Chang Yan 1 , Henner Kampwerth 1 , Xiaojing Hao 1
Physica Status Solidi-Rapid Research Letters ( IF 2.5 ) Pub Date : 2020-06-26 , DOI: 10.1002/pssr.202000283 Chaowei Xue 1 , Jialiang Huang 1 , Kaiwen Sun 1 , Chang Yan 1 , Henner Kampwerth 1 , Xiaojing Hao 1
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The presence of ZnS precipitates is common in Cu2ZnSnS4 (CZTS) films due to the preferred Cu‐poor and Zn‐rich composition for high‐efficiency CZTS devices. It is important to identify their distribution in the film as it can serve as a fingerprint for the CZTS forming process. However, limited methods are viable to quantify their distribution as they are small in size and few in number. Herein, a fast and cost‐effective chemical treatment is presented that can reveal the nanoscale ZnS domains within CZTS films to be captured under a common scanning electron microscope (SEM). This method exploits a hole‐injection process driven by gold catalysis and the band alignment between CZTS and ZnS. ZnS precipitates as small as 10 nm in diameter can be revealed clearly. Using this approach, a characteristic lognormal size distribution of the ZnS precipitates close to the CZTS film surface with a median diameter of 80 nm and a density of around 2 in a 1 μm2 surface area is demonstrated. Energy‐dispersive X‐ray spectroscopy (EDS) mapping and scanning transmission electron microscopy (STEM) imaging further confirm the existence of ZnS precipitates in the film. This method provides a fast means for capturing fingerprints of ZnS precipitations in CZTS process.
中文翻译：
催化化学刻蚀揭示Cu2ZnSnS4薄膜中的纳米域
ZnS沉淀物的存在在Cu 2 ZnSnS 4中很常见（CZTS）膜是由于高效CZTS器件首选的贫铜和富锌成分。识别它们在胶片中的分布很重要，因为它可以用作CZTS形成过程的指纹。但是，有限的方法可以量化其分布，因为它们体积小且数量很少。本文介绍了一种快速且具有成本效益的化学处理方法，该方法可以揭示CZTS膜中的纳米级ZnS域，该域将在普通扫描电子显微镜（SEM）下捕获。该方法利用了由金催化以及CZTS和ZnS之间的能带对准驱动的空穴注入过程。可以清楚地发现直径最小为10 nm的ZnS沉淀物。使用这种方法，说明了2个表面积。能量色散X射线能谱（EDS）映射和扫描透射电子显微镜（STEM）成像进一步证实了薄膜中存在ZnS沉淀。该方法提供了一种在CZTS过程中捕获ZnS沉淀指纹的快速方法。
更新日期：2020-06-26
中文翻译：
催化化学刻蚀揭示Cu2ZnSnS4薄膜中的纳米域
ZnS沉淀物的存在在Cu 2 ZnSnS 4中很常见（CZTS）膜是由于高效CZTS器件首选的贫铜和富锌成分。识别它们在胶片中的分布很重要，因为它可以用作CZTS形成过程的指纹。但是，有限的方法可以量化其分布，因为它们体积小且数量很少。本文介绍了一种快速且具有成本效益的化学处理方法，该方法可以揭示CZTS膜中的纳米级ZnS域，该域将在普通扫描电子显微镜（SEM）下捕获。该方法利用了由金催化以及CZTS和ZnS之间的能带对准驱动的空穴注入过程。可以清楚地发现直径最小为10 nm的ZnS沉淀物。使用这种方法，说明了2个表面积。能量色散X射线能谱（EDS）映射和扫描透射电子显微镜（STEM）成像进一步证实了薄膜中存在ZnS沉淀。该方法提供了一种在CZTS过程中捕获ZnS沉淀指纹的快速方法。
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