Cover Photograph: Small angle X‐ray scattering images of MgAl₂O₄ irradiated by swift heavy ions (SHI) of 100 MeV Xe to a fluence of 1 × 1013 cm_–2. (a) The sample was set with the X‐ray beam incident parallel to the direction of SHI irradiation, whereas (b‐d) the sample was tilted to 1°, 5°, and 15°, respectively, with respect to the X‐ray beam. The two vertical lines and central spot without intensities visible in each image are gaps due to the detector module edge and the catcher for the incident X‐ray beam, respectively. Analyses on these images showed that the defects induced by the SHIs were cylindrical shape ones (ion tracks) with a diameter of 5.1±1.4 nm, and that cations at tetrahedral and octahedral sites inside the ion tracks were significantly disordered. Cover Credit: Satoru Yoshioka, Kyushu University. DOI;10.1111/jace.17101.

中文翻译：

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发行信息

封面照片： 100 MeV Xe的快速重离子（SHI）辐照至1×1013 cm _–2的通量对MgAl ₂ O _4的小角度X射线散射图像。（a）样品的X射线束平行于SHI照射的方向入射，而（b-d）样品相对于X分别倾斜到1°，5°和15°射线束。由于检测器模块边缘和入射X射线束的捕集器，在每幅图像中可见的两条垂直线和没有光点的中心点分别是间隙。对这些图像的分析表明，由SHI引起的缺陷是直径为5.1±1.4 nm的圆柱形缺陷（离子迹线），并且离子迹线内四面体和八面体位点的阳离子明显无序。封面信用：九州大学吉冈聪。DOI； 10.1111 / jace.17101。