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Identifying, understanding and controlling defects and traps in halide perovskites for optoelectronic devices: a review
Journal of Physics D: Applied Physics ( IF 3.1 ) Pub Date : 2020-06-25 , DOI: 10.1088/1361-6463/ab9134
Xiaoxuan Chen 1 , Shijia Cheng 1 , Lian Xiao 1 , Handong Sun 1, 2, 3
Affiliation  

In the past decade, halide perovskite materials have captivated a great deal of attention for the application in optoelectronic devices. To realize the commercialization of optoelectronic devices made from this exhilarating material system, in particular to boost the efficiency and the stability, the formation mechanisms of defects, their impact on device performance and lifetime and the way to overcome them must be thoroughly investigated. In this review, the current understanding of the defect creation mechanism in as-synthesized and environment-exposed samples will be presented. The defect induced phenomenon and their impact on the material properties and device performances will be explained. The various defect characterization techniques will be summarized regarding their working principles and limitations. The defect engineering including both physical and chemical methods will be discussed in detail. We believe that although there are still unsolved puzzles in the field, ...

中文翻译:

识别,理解和控制光电子器件卤化物钙钛矿中的缺陷和陷阱:综述

在过去的十年中,卤化物钙钛矿材料在光电器件中的应用引起了极大的关注。为了实现由这种令人兴奋的材料系统制成的光电器件的商业化,特别是为了提高效率和稳定性,必须彻底研究缺陷的形成机理,它们对器件性能和寿命的影响以及克服这些缺陷的方法。在这篇综述中,将介绍对合成样品和环境暴露样品中缺陷产生机理的当前理解。将解释由缺陷引起的现象及其对材料性能和器件性能的影响。关于它们的工作原理和局限性,将总结各种缺陷表征技术。将详细讨论包括物理和化学方法在内的缺陷工程。我们认为,尽管该领域仍存在未解之谜,但...
更新日期:2020-06-26
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