当前位置: X-MOL 学术IEEE Des. Test › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
From the EIC: Special Issue on Image Processing, Correspondsing Hardware Architectures, and EDA Tools
IEEE Design & Test ( IF 2 ) Pub Date : 2020-06-23 , DOI: 10.1109/mdat.2020.3000447
Jorg Henkel

A highlight of this IEEE Design&Test issue is on image processing, corresponding hardware architectures, and EDA tools from the 2018 Symposium on Integrated Circuits and Systems Design (SBCCI 2018). The guest editors Michael Hübner and Jose Luis Guntzel have selected six significantly extended manuscripts for a careful review process. The presented special issue (SI) gives a good insight into the excellent research conduct in Latin America.

中文翻译:

从EIC:图像处理,相应的硬件体系结构和EDA工具的特刊

的亮点 这个IEEE 设计与测试问题来自2018年集成电路与系统设计研讨会(SBCCI 2018)上的图像处理,相应的硬件体系结构和EDA工具。特邀编辑MichaelHübner和Jose Luis Guntzel选择了六种经过扩展的手稿,以进行仔细的审查。提出的特刊(SI)对拉丁美洲的出色研究行为有很好的了解。
更新日期:2020-06-26
down
wechat
bug