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Metal-Halide Perovskite Design for Next-Generation Memories: First-Principles Screening and Experimental Verification.
Advanced Science ( IF 14.3 ) Pub Date : 2020-06-26 , DOI: 10.1002/advs.202001367
Ju-Hyun Jung 1 , Seong Hun Kim 1 , Youngjun Park 1 , Donghwa Lee 1, 2 , Jang-Sik Lee 1
Affiliation  

Memory devices have been advanced so much, but still it is highly required to find stable and reliable materials with low‐power consumption. Halide perovskites (HPs) have been recently adopted for memory application since they have advantages of fast switching based on ionic motion in crystal structure. However, HPs also suffer from poor stability, so it is necessary to improve the stability of HPs. In this regard, combined first‐principles screening and experimental verification are performed to design HPs that have high environmental stability and low‐operating voltage for memory devices. First‐principles screening identifies 2D layered AB2X5 structure as the best candidate switching layer for memory devices, because it has lower formation energy and defect formation energy than 3D ABX3 or other layered structures (A3B2X7, A2BX4). To verify results, all‐inorganic 2D layered CsPb2Br5 is synthesized and used in memory devices. The memory devices that use CsPb2Br5 show much better stability and lower operating voltages than devices that use CsPbBr3. These findings are expected to provide new opportunity to design materials for reliable device applications based on calculation, screening, and experimental verification.

中文翻译:

下一代存储器的金属卤化物钙钛矿设计:第一原理筛选和实验验证。

存储器件已经进步了很多,但仍然非常需要找到稳定可靠、低功耗的材料。卤化物钙钛矿(HP)最近被用于存储器应用,因为它们具有基于晶体结构中离子运动的快速切换的优点。但HP的稳定性也较差,因此有必要提高HP的稳定性。在这方面,结合第一原理筛选和实验验证,设计出具有高环境稳定性和低工作电压的存储器件HP。第一原理筛选将 2D 分层 AB 2 X 5结构确定为存储器件的最佳候选切换层,因为它比 3D ABX 3或其他分层结构(A 3 B 2 X 7、 A 2 BX 4)。为了验证结果,合成了全无机二维层状 CsPb 2 Br 5并将其用于存储器件。使用CsPb 2 Br 5的存储器件比使用CsPbBr 3 的器件表现出更好的稳定性和更低的工作电压。这些发现预计将为基于计算、筛选和实验验证的可靠设备应用设计材料提供新的机会。
更新日期:2020-08-19
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