In high energy PIXE, a high energy ion beam, up to several tens of MeV, is used to analyze heavy elements in a thick sample. The knowledge of the interaction cross-section with the atoms is essential to perform quantitative analysis. As measured data in this range of energy are scarce, an experimental campaign was conducted at the C70 cyclotron of the GIP ARRONAX to measure the K-X-ray production cross-sections for silver and gold with proton energies 30, 42, 54 and 68 MeV. The detector efficiency, the beam intensity, and the target thickness were measured accurately to produce precise data. To convert the K-X-ray production cross-sections into the K-shell ionization cross-sections, an average value of the K-shell fluorescence yield, calculated from a compilation of existing data, was used. The outcomes of the campaign are in good agreement with the few existing data and the theoretical prediction of the RECPSSR model.

在高能PIXE中，高达数十MeV的高能离子束用于分析厚样品中的重元素。与原子的相互作用截面的知识对于进行定量分析至关重要。由于此能量范围内的测量数据稀缺，因此在GIP ARRONAX的C70回旋加速器上进行了一项实验，以测量质子能分别为30、42、54和68 MeV的银和金的KX射线产生截面。准确测量探测器的效率，光束强度和目标厚度，以产生精确的数据。为了将KX射线产生的横截面转换成K壳电离横截面，使用从现有数据的汇编中计算出的K壳荧光产量的平均值。