Abstract Although the luminescence characteristics of persistent phosphors have been extensively investigated, the physical mechanism underlying their afterglow is not yet fully understood. Many variables influence the outcome of thermoluminescence, charging and afterglow experiments, hampering a correct interpretation. Here we investigate the role of deep, thermally stable traps in SrAl 2 O 4 :Eu 2 + ,Dy 3 + which received little attention in previous studies. We demonstrate that these traps have a considerably higher trapping cross-section than the shallow traps, which are responsible for the persistent luminescence. This affects the charging dynamics of the shallow traps significantly and should therefore be considered in behavioral studies of these phosphors.

中文翻译：

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在测量持久性磷光体的余辉和热释光时，深陷阱的几乎隐藏作用

摘要 虽然持久性荧光粉的发光特性已被广泛研究，但其余辉背后的物理机制尚未完全了解。许多变量会影响热释光、充电和余辉实验的结果，妨碍正确解释。在这里，我们研究了 SrAl 2 O 4 :Eu 2 + ,Dy 3 + 中深部热稳定陷阱的作用，这在以前的研究中很少受到关注。我们证明这些陷阱具有比浅陷阱高得多的陷阱截面，浅陷阱负责持续发光。这会显着影响浅陷阱的充电动力学，因此应在这些磷光体的行为研究中加以考虑。