The IR spectrometric method for determination of hydrogen impurities in the form of SH-groups in liquid sulfur is developed. The temperature dependence of the content of SH-groups in sulfur samples in the range of 300–550 °C is studied. The technique for deep sulfur purification including vacuum distillation, passing sulfur vapor through catalysts based on silicon, aluminum and cerium oxides, and filtering the vapor using high-purity silica-glass micro-filters is developed. The sulfur containing 40±4 ppb(at) SH-group is prepared. By using the high-purity sulfur samples of various origins, Ga₅Ge₃₆S₅₉ glasses are synthesized. Sulfur is shown to be the essential source of hydrogen impurity and heterogeneous inclusions in the glasses. The minimum hydrogen content in the form of SH-groups in the Ga₅Ge₃₆S₅₉ glass sample, prepared from the sulfur purified using the developed technique, is 0.10±0.02 ppm(at). The content of heterogeneous micron-sized inclusions in this glass sample is not exceed 10 pieces/cm³.

建立了红外光谱法测定液态硫中SH基形式的氢杂质。研究了硫样品中SH-基团含量在300-550°C范围内的温度依赖性。开发了用于深度硫纯化的技术，包括真空蒸馏，使硫蒸气通过基于硅，铝和氧化铈的催化剂，以及使用高纯度石英玻璃微过滤器过滤蒸气。制备了含硫40-4 ppb（at）SH-基团。通过使用各种来源的高纯度硫样品，Ga ₅ Ge ₃₆ S ₅₉眼镜是合成的。硫是玻璃中氢杂质和异质夹杂物的主要来源。由使用发达技术纯化的硫制得的Ga ₅ Ge ₃₆ S ₅₉玻璃样品中的SH基形式的最小氢含量为0.10±0.02 ppm（at）。该玻璃样品中微米级杂质的含量不超过10个/ cm ³。