This work aimed to investigate the ionizing radiation shielding features of zirconia silicate SiO₂Na₂OCaO —xZrO₂ (SCNZ) glass system. The mass attenuation coefficients (μ/ρ) were generated by FLUKA Monte Carlo simulation code and the obtained data was verified via the calculated data from XCOM software over an extended photon energy range of 0.015 – 20 MeV. The obtained values of μ/ρ were used to evaluate several important shielding parameters such as half value layer (HVL), mean free path (MFP), effective atomic number (Z_eff), and effective electron density (N_eff). Results reveal that μ/ρ, MFP, HVL, Z_eff, and N_eff of the investigated glasses strongly depend on photon energy and chemical composition. Additionally, by using GP fitting parameters, the exposure buildup factor (EBF) of the investigated glasses were calculated. Results show that the greatest values of buildup factors exhibit at higher energies for all glass samples. Finally, the values of fast neutron removal cross section (Σ_R) and the kinetic energy loss rate (Mass Stopping Power, MSP) of alphas and protons passing through the studied glasses were evaluated. Results display that the insertion of ZrO₂ improves the nuclear shielding capability of SCNZ glasses. Especially, SCNZ7 glass owns superior shielding ability for charged particles as well as gamma radiation.

这项工作旨在研究氧化锆硅酸盐SiO ₂ Na ₂ O CaO -xZrO ₂（SCNZ）玻璃系统的电离辐射屏蔽特性。质量衰减系数（μ/ρ）由FLUKA蒙特卡罗模拟代码生成，所得数据通过XCOM软件在0.015 – 20 MeV扩展光子能量范围内的计算数据进行验证。所获得的μ/ρ值用于评估几个重要的屏蔽参数，例如半值层（HVL），平均自由程（MFP），有效原子序数（Z _eff）和有效电子密度（N _eff）。结果表明，μ/ρ，MFP，HVL，Z _{EFF ，}和N _EFF被研究的玻璃的高度依赖于光子能量和化学成分。另外，通过使用GP拟合参数，可以计算出所研究眼镜的曝光累积因子（EBF）。结果表明，对于所有玻璃样品，堆积因子的最大值在较高能量下均表现出。最后，除去中子快速截面（Σ的值_[R ）和动能损失率（质量停止电源，MSP）阿尔法和质子穿过所研究的眼镜进行了评价。结果表明，ZrO ₂的插入改善了SCNZ玻璃的核屏蔽能力。特别是，SCNZ7玻璃对带电粒子以及伽马射线具有出色的屏蔽能力。