The deformation behaviors of W nanowires embedded in a TiNi matrix were investigated by means of in-situ synchrotron high energy X-ray diffraction (HEXRD) and in-situ transmission electron microscopy (TEM) analysis during tensile deformation. The HEXRD measurement indicated that the W nanowires exhibited an average lattice strain of about 1.50 %, whereas the TEM examination revealed a local elastic strain of about 4.59 % in areas adjacent to the TiNi matrix where stress-induced martensitic transformation occurred. This strain corresponds to a stress of ∼15 GPa for the W nanowires. In addition, in areas adjacent to the TiNi matrix where plastic deformation and cracking were generated, the W nanowire showed significant ductile necking with ∼80 % reduction in cross-section area. The ductile necking of W nanowire is attributed to the lack of protection from the stress-induced martensitic transformation of the TiNi matrix.

通过原位同步加速器高能X射线衍射（HEXRD）和拉伸变形过程中的原位透射电子显微镜（TEM）分析，研究了嵌入TiNi基体中的W纳米线的变形行为。HEXRD测量表明，W纳米线表现出约1.50％的平均晶格应变，而TEM检查显示，在邻近TiNi基体的区域（发生应力诱导的马氏体转变），其局部弹性应变约为4.59％。对于W纳米线，此应变对应于约15 GPa的应力。此外，在与TiNi基体相邻的区域中，会发生塑性变形和破裂，W纳米线表现出明显的延展性颈缩，横截面积减少约80％。