In this work, we used ion beam analyses (IBA) to characterize doped ZnO crystalline nanoparticles elaborated by different methods: (i) low energy cluster beam deposition (LECBD) for ZnO:Ga, (ii) metal organic framework (MOF) for ZnO:Li and (iii) sol-gel for ZnO/SiO_x core-shell system.

The analyses were performed either in RBS mode using ⁴He⁺⁺ ions of 6 MeV energy (characterization of Ga and Si) or in NRA mode using ¹H⁺ ions of 2.5 MeV energy (characterization of Li). The experimental data allowed determining the mean concentration of dopants (Ga, Li) or shell atoms (Si) and their areal masses. These elemental information, coupled with structural (TEM, X-ray) and optical (IR spectroscopy, photoluminescence) ones, were of prime importance permitting to better understand the optical properties of doped ZnO nanocrystals.

在这项工作中，我们使用离子束分析（IBA）来表征通过不同方法制作的掺杂ZnO晶体纳米颗粒：（i）ZnO：Ga的低能簇束沉积（LECBD），（ii）ZnO的金属有机骨架（MOF） ：Li和（iii）ZnO / SiO _x核-壳体系的溶胶-凝胶。

分析是在RBS模式下使用⁴ MeV能量的⁴ He ⁺⁺离子（Ga和Si的表征）或在NRA模式下使用¹ H ⁺离子的2.5 MeV能量（Li的表征）进行的。实验数据可以确定掺杂剂（Ga，Li）或壳原子（Si）的平均浓度及其单位面积质量。这些元素信息，再加上结构（TEM，X射线）和光学（IR光谱，光致发光）信息，具有至关重要的作用，可以更好地理解掺杂的ZnO纳米晶体的光学特性。