Abstract Structure and magnetoimpedance (MI) properties of Permalloy films electrodeposited on Indium Tin Oxide (ITO) coated on glass substrate have been investigated. Microstructure and magnetic measurements confirm the composition and formation of single phase films with varying thickness. The MI values increased from 2.8% to 50%, while the frequency at which maximum MI is observed shifted to lower frequency when thickness of the NiFe film is increased. Present results show that MI is not only weak but also exhibits a sign change in the lower frequency range. It is shown that the magnetoinductive component is dominant at lower frequencies. Thickness and frequency dependence of MI values are compared with numerically calculated results on the basis of Maxwell’s and Landau- Lifshitz equations. It is found that the thickness and effective conductivity of the film play a significant role in variation of MI values. We have attempted to extract the relative magnetic permeability (μr), the damping factor (α), the angle between the equilibrium state of magnetization and easy axis (θ) and the magnetic anisotropy field (Hk) by fitting the experimental MI data to the standard equations. Experimental results are consistent with the physical parameters obtained from the phenomenological model. The relative permeability values extracted from the MI data corroborate well with magnetic measurements of literature.

中文翻译：

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电沉积在 ITO 基板上的 NiFe 薄膜的微观结构和磁阻抗研究：实验和模拟

摘要 研究了电沉积在玻璃基板上的氧化铟锡 (ITO) 上的坡莫合金薄膜的结构和磁阻抗 (MI) 特性。显微结构和磁性测量证实了具有不同厚度的单相膜的组成和形成。MI 值从 2.8% 增加到 50%，而当 NiFe 膜的厚度增加时，观察到最大 MI 的频率转移到较低频率。目前的结果表明，MI 不仅很弱，而且在较低的频率范围内也表现出符号变化。结果表明，磁感分量在较低频率下占主导地位。将 MI 值的厚度和频率相关性与基于麦克斯韦方程和兰道-利夫希茨方程的数值计算结果进行比较。发现薄膜的厚度和有效电导率对 MI 值的变化起着重要作用。我们已经尝试通过将实验 MI 数据拟合到磁导率 (μr)、阻尼因子 (α)、磁化平衡状态与易轴 (θ) 和磁各向异性场 (Hk) 之间的角度来提取相对磁导率 (μr)、阻尼因子 (α)、标准方程。实验结果与从现象学模型中得到的物理参数一致。从 MI 数据中提取的相对磁导率值很好地证实了文献中的磁测量结果。通过将实验 MI 数据拟合到标准方程，磁化平衡状态和易轴 (θ) 与磁各向异性场 (Hk) 之间的角度。实验结果与从现象学模型中得到的物理参数一致。从 MI 数据中提取的相对磁导率值很好地证实了文献中的磁测量结果。通过将实验 MI 数据拟合到标准方程，磁化平衡状态和易轴 (θ) 与磁各向异性场 (Hk) 之间的角度。实验结果与从现象学模型中得到的物理参数一致。从 MI 数据中提取的相对磁导率值很好地证实了文献中的磁测量结果。