An in-depth structural study of a 23-nm-thick ${\mathrm{BiFeO}}_3$ film grown on orthorhombic ${\mathrm{NdScO}}_3{\left(110\right)}_O$ substrates demonstrates the presence of a mixed phases. Atomic resolution scanning transmission electron microscopy measurements reveal an out-of-plane stripe domain structure typical of rhombohedral ${\mathrm{BiFeO}}_3$ films but with a polarization component along pseudocubic ${〈100〉}_{PC}$ or canted from the ${〈111〉}_{PC}$ towards the in-plane direction. Photovoltaic measurements display an anomalous modulation of the open circuit voltage as temperature is decreased that is attributed to a structural change associated with a transition to a single structural phase.

中文翻译：

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拉伸应变BiFeO3的结构和光电性能

深入研究23纳米厚的结构 ${\mathrm{二氧化铁}}_3$ 在斜方晶体上生长的薄膜 ${\mathrm{钕铁硼}}_3{\left(110\right)}_{Ø}$底物证明存在混合相。原子分辨率扫描透射电子显微镜测量显示菱面体典型的面外条纹域结构${\mathrm{二氧化铁}}_3$ 胶片，但具有沿伪立方的偏振分量 ${〈100〉}_{PC}$ 或从 ${〈111〉}_{PC}$朝向平面内方向。光伏测量显示随着温度降低，开路电压的异常调制，这归因于与过渡到单个结构相有关的结构变化。