ABSTRACT Nanostructured microwave absorbing materials attract researchers because of their ability to combat electromagnetic (EM) pollution generated by high-speed electronic gadgets without interrupting gadget mobility. In the reported work, the nanosized meta copper material C2101 Kopu Tharma Loham also called nano twin crystalline copper metal fabricated as per ancient Indian metallurgical technology is characterized to ensure its microwave absorbing properties. X-ray diffraction analysis reveals that the particle size of meta copper samples is 100 nm. Further, the melting temperature of meta copper material is 1135ºC higher than copper metal (1085ºC as per International copper standards) making the absorber thermally stable. The EM properties have been experimentally measured through different techniques for frequency ranging from 2 to 40 GHz. The loss tangent plots show that the proposed material performs better in X band. The reflection loss graphs are plotted for different sample thickness values and optimal reflection loss dip of −34.4 dB is obtained at 9.5 GHz for thickness of 2.2 mm. Proposed absorbing material can be integrated on an array substrate for sidelobe level reduction or can be incorporated on aircraft surface for radar cross-section reduction.

中文翻译：

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纳米结构铜基电磁波吸收器的表征和测量

摘要 纳米结构吸波材料吸引了研究人员，因为它们能够在不中断设备移动性的情况下对抗高速电子设备产生的电磁 (EM) 污染。在报道的工作中，纳米尺寸的金属铜材料 C2101 Kopu Tharma Loham 也称为纳米双晶铜金属，根据古代印度冶金技术制造，其特征是确保其微波吸收性能。X 射线衍射分析表明，偏铜样品的粒径为 100 nm。此外，金属铜材料的熔化温度比铜金属高 1135ºC（国际铜标准为 1085ºC），使吸收器具有热稳定性。已经通过不同技术对 2 至 40 GHz 频率范围内的 EM 特性进行了实验测量。损耗角正切图显示所提出的材料在 X 波段表现更好。针对不同的样品厚度值绘制了反射损耗图，并且在 9.5 GHz 下对于 2.2 mm 的厚度获得了 -34.4 dB 的最佳反射损耗下降。提议的吸波材料可以集成在阵列基板上以降低旁瓣电平，也可以结合在飞机表面以减少雷达截面。