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Colloid-SEM method for the investigation of magnetic domain structures.
Micron ( IF 2.5 ) Pub Date : 2020-06-15 , DOI: 10.1016/j.micron.2020.102899
A I Ivanova 1 , E M Semenova 1 , O V Zhdanova 1 , T V Rostova 1 , R M Grechishkin 1
Affiliation  

The paper presents scanning electron microscopy (SEM) studies on the magnetic domain structure (DS) using magnetic colloid. The possibility of colloid-SEM method for observing the DS of mono- and polycrystalline samples in the secondary (SEI) and backscattered electrons modes (BEC) is demonstrated. Owing to the large focal depth of SEM, it is possible to observe the overall DS and fine features, even in unpollished samples.



中文翻译:

胶体SEM方法研究磁畴结构。

本文介绍了使用磁胶体对磁畴结构(DS)进行扫描电子显微镜(SEM)研究。胶体SEM方法用于观察单晶和多晶样品在次级(SEI)和背向散射电子模式(BEC)中的DS的可能性已得到证明。由于SEM的焦深很大,因此即使在未污染的样品中,也可以观察到整个DS和精细特征。

更新日期:2020-06-15
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