Impedance spectroscopy was conducted on colloidal ITO thin films that had been subjected to alternating oxygen and argon plasma treatments, followed by air annealing from 150 to 750 °C. An equivalent circuit consisting of an RC element nested within another RC element, featuring a negative resistance and a negative capacitance, fitted the data well. These results are interpreted as being due to surface plasmons that are a function of the presence of nanoporous ITO-rich regions surrounded by isolated ITO nanoparticles coated with an amorphous polymer that intertwines with the ITO-rich regions as a function of annealing treatment.

阻抗光谱是在胶体ITO薄膜上进行的，该薄膜经过交替的氧气和氩气等离子体处理，然后在150至750°C的温度下进行空气退火。由一个嵌套在另一个RC元件中的RC元件组成的等效电路具有负电阻和负电容，可以很好地拟合数据。这些结果被解释为是由于表面等离激元引起的，所述表面等离激元是纳米多孔富含ITO的区域的存在的函数，所述纳米多孔富含ITO的区域被涂覆有无定形聚合物的分离的ITO纳米颗粒围绕，所述非晶聚合物与所述富含ITO的区域缠绕，作为退火处理的函数。