当前位置: X-MOL 学术IEEE Trans. Device Mat Reliab. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Energy Transformation between the Inductor and the Power Transistor for the Unclamped Inductive Switching (UIS) Test
IEEE Transactions on Device and Materials Reliability ( IF 2.5 ) Pub Date : 2020-06-01 , DOI: 10.1109/tdmr.2020.2985306
Karuna Nidhi , Jian-Hsing Lee , Shao-Chang Huang , Ming-Dou Ker

The fundamental model of energy transformation between the inductor and the power transistor for the unclamped inductive switching (UIS) test is inspected. Based on the experimental results, the energy stored in the inductor at the period of the channel turn-on can be dissipated by the power transistor after the channel is turned off. In this work, a new theoretical model to well describe the electrical and thermal behaviors of the power transistor during the unclamped inductive switching (UIS) test has been identified and analyzed with the experimental silicon results under different inductor values in 0.15 $\mu \text{m}$ BCD process. The total UIS energy reduced due to series resistance of the inductor and the power transistor has been theoretically explained and well matches with the experimental measured results on silicon.

中文翻译:

用于非钳位电感开关 (UIS) 测试的电感器和功率晶体管之间的能量转换

检查了用于非钳位感应开关 (UIS) 测试的电感器和功率晶体管之间能量转换的基本模型。根据实验结果,通道导通期间电感中储存的能量可以在通道关闭后由功率晶体管耗散。在这项工作中,一个新的理论模型可以很好地描述未钳位电感开关 (UIS) 测试期间功率晶体管的电气和热行为,并使用 0.15 $\mu \text 不同电感值下的实验硅结果{m}$ BCD 进程。由于电感器和功率晶体管的串联电阻而降低的总 UIS 能量已在理论上得到解释,并且与硅上的实验测量结果非常匹配。
更新日期:2020-06-01
down
wechat
bug