Correlation between ion impurity in thermally activated delayed fluorescence organic light‐emitting diode materials and device lifetime,Journal of the Society for Information Display

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Correlation between ion impurity in thermally activated delayed fluorescence organic light‐emitting diode materials and device lifetime
Journal of the Society for Information Display ( IF 1.7 ) Pub Date : 2020-06-08 , DOI: 10.1002/jsid.922
Masaru Inoue ₁ , Noriaki Oyabu ₂ , Yoshiyuki Kaneko ₃ , Jun‐Yun Kim ₄ , Joong‐Hwan Yang ₅

Affiliation

We propose a measurement method of ion impurity amounts of thermally activated delayed fluorescence (TADF) green dopant powders in a solution by applying a triangle voltage waveform and measuring a small displacement current that has been developed for screening and optimization of materials for thin‐film transistor‐liquid crystal displays (TFT‐LCDs). We found that there is a strong correlation between ion impurity and organic light‐emitting diode (OLED) lifetime, and we confirmed that the TADF green dopant, having a large number of ion impurity, has short OLED lifetime.

中文翻译：

热活化延迟荧光有机发光二极管材料中的离子杂质与器件寿命之间的关系

我们提出了一种通过施加三角电压波形并测量小的位移电流来测量溶液中热活化延迟荧光（TADF）绿色掺杂剂粉末的离子杂质量的方法，该方法已开发用于筛选和优化薄膜晶体管的材料-液晶显示器（TFT-LCD）。我们发现离子杂质与有机发光二极管（OLED）的寿命之间存在很强的相关性，并且我们确认了离子杂质很多的TADF绿色掺杂剂的OLED寿命很短。

更新日期：2020-06-08

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