Local mechanical properties of submicron features are of particular interest due to their influence on macroscopic material performance and behaviour. This study is focused on local nanomechanical measurements, based on the latest Atomic Force Microscopy (AFM) mode, where the peak force set point is finely controlled at each pixel. After probe calibration, we evaluate the impact of spring constant of two AFM hand‐crafted natural full diamond tips with steel cantilevers, used for mapping. Based on the fast capture of the cantilever deflection at each pixel and real time force curve analysis in the elastic region, AFM local measured contact moduli mappings of the silica beads (>50 GPa) incorporated in an epoxy resin matrix, are compared with those determined using classical instrumented nanoindentation tests. Our analyses show that with the two AFM probes, without local residual deformation, the high moduli of the silica beads measured with this advanced AFM mode are within the standard deviation of the values determined by classical nanoindentation.

中文翻译：

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纳米尺度高模量材料的定量测绘：原子力显微镜与纳米压痕的比较研究


亚微米特征的局部机械性能因其对宏观材料性能和行为的影响而受到特别关注。这项研究的重点是基于最新原子力显微镜 (AFM) 模式的局部纳米力学测量，其中峰值力设定点在每个像素处得到精细控制。探头校准后，我们​​评估了两个 AFM 手工制作的带有钢悬臂的天然全金刚石尖端（用于测绘）的弹簧常数的影响。基于每个像素处悬臂偏转的快速捕获和弹性区域中的实时力曲线分析，将 AFM 局部测量的环氧树脂基体中二氧化硅珠 (>50 GPa) 的接触模量映射与确定的接触模量映射进行比较使用经典的仪器纳米压痕测试。我们的分析表明，使用两个 AFM 探针，在没有局部残余变形的情况下，使用这种先进的 AFM 模式测量的二氧化硅珠的高模量在经典纳米压痕测定值的标准偏差范围内。