Abstract The industrial-scale production and commercialisation of graphene and related 2D materials introduces the need for rapid, reliable and cost-effective quality control procedures. Currently, microscopy-based techniques are used to measure the lateral size and thickness of particles but while powerful, these techniques suffer from limitations such as lengthy analysis time, high costs and limited sampling. In the case of carbon-based 2D materials, as the stacking of multiple graphene sheets causes a reduction in the surface to mass ratio, the number of layers can hypothetically be calculated by comparing the theoretical surface area of monolayer graphene (2630 m2/g) to the calculated specific surface area (SSA) measured by gas physisorption measurements. However, despite the potential of this method of analysis, there is limited understanding regarding the characterisation of commercial graphene/graphite powders produced via bottom-up and top-down methods. Herein, the SSAs of a variety of commercially-available graphitic powders were measured using nitrogen physisorption isotherms at 77 K and applying Brunauer-Emmett-Teller theory. The as-obtained SSAs were then correlated to the structural and chemical properties of the materials (obtained using conventional techniques) to demonstrate the suitability of this measurement technique for quality control of graphitic powders.

中文翻译：

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气体物理吸附测量作为石墨烯/石墨粉末特性的质量控制工具

摘要石墨烯和相关二维材料的工业规模生产和商业化引入了对快速、可靠和具有成本效益的质量控制程序的需求。目前，基于显微镜的技术用于测量颗粒的横向尺寸和厚度，虽然功能强大，但这些技术受到分析时间长、成本高和采样有限等限制。在碳基二维材料的情况下，由于多个石墨烯片的堆叠导致表面积与质量比的降低，可以通过比较单层石墨烯的理论表面积（2630 m2 / g）来假设计算层数通过气体物理吸附测量计算得出的比表面积 (SSA)。然而，尽管这种分析方法具有潜力，对于通过自下而上和自上而下的方法生产的商业石墨烯/石墨粉末的特性，了解有限。在本文中，使用 77 K 下的氮物理吸附等温线并应用 Brunauer-Emmett-Teller 理论测量了各种市售石墨粉末的 SSA。然后将获得的 SSA 与材料的结构和化学性质（使用常规技术获得）相关联，以证明这种测量技术适用于石墨粉末的质量控制。使用 77 K 下的氮物理吸附等温线并应用 Brunauer-Emmett-Teller 理论测量各种市售石墨粉末的 SSA。然后将获得的 SSA 与材料的结构和化学性质（使用常规技术获得）相关联，以证明这种测量技术适用于石墨粉末的质量控制。使用 77 K 下的氮物理吸附等温线并应用 Brunauer-Emmett-Teller 理论测量各种市售石墨粉末的 SSA。然后将获得的 SSA 与材料的结构和化学性质（使用常规技术获得）相关联，以证明这种测量技术适用于石墨粉末的质量控制。