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Reliability of RF MEMS switches at cryogenic (liquid He) temperatures
Microelectronics Reliability ( IF 1.6 ) Pub Date : 2020-08-01 , DOI: 10.1016/j.microrel.2020.113706 R.R. Benoit , N.S. Barker
Microelectronics Reliability ( IF 1.6 ) Pub Date : 2020-08-01 , DOI: 10.1016/j.microrel.2020.113706 R.R. Benoit , N.S. Barker
Abstract This paper reports on the reliability of RF MEMS switches operating in a cryogenic (
中文翻译:
RF MEMS 开关在低温(液态 He)温度下的可靠性
摘要 本文报告了在低温环境中运行的 RF MEMS 开关的可靠性。
更新日期:2020-08-01
中文翻译:
RF MEMS 开关在低温(液态 He)温度下的可靠性
摘要 本文报告了在低温环境中运行的 RF MEMS 开关的可靠性。