Abstract In this paper, we aimed to investigate the reliability of an organic light-emitting diode (OLED) and propose a SPICE compatible electrical model for automotive exterior lighting applications. The proposed model smoothly provides the forward and reverse current-voltage relation and also dynamic capacitive behavior of OLED is included in the model. The Automotive Electronics Council-Qualified (AEC-Q) OLED samples that are currently used in a rear stop lamp have been electrically stressed with the current density of J = 11.5 mA/cm2 (25% more than the nominal current density value) at room temperature. The model was presented through theoretical equations for forward and reverse current-voltage characteristics and impedance behavior of OLED. The simulated and experimental results are in close agreement with each other. We characterized the intrinsic capacitance, operational voltage, wavelength, and luminance variation of OLED aged under electrical stress for 7040 h. We utilized a simple setup to monitor variations in light intensity of the tested device with a CMOS camera. Under pure electrical stress, the dominant wavelength was slightly red-shifted by 3.29 nm, the threshold voltage of the OLED is increased from 4.2 V to 5.25 V, and luminance decayed to 88% of the initial luminance with stress time, whereas spectral shape was not affected.

中文翻译：

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电应力下汽车级 OLED 的实验和建模研究

摘要 在本文中，我们旨在研究有机发光二极管 (OLED) 的可靠性，并提出一种适用于汽车外部照明应用的 SPICE 兼容电气模型。所提出的模型平滑地提供了正向和反向电流 - 电压关系，并且模型中还包括 OLED 的动态电容行为。目前用于尾刹车灯的汽车电子委员会认证 (AEC-Q) OLED 样品已在室温下施加电流密度 J = 11.5 mA/cm2（比标称电流密度值高 25%）温度。该模型是通过 OLED 正向和反向电流-电压特性和阻抗行为的理论方程来呈现的。模拟结果和实验结果非常吻合。我们表征了 OLED 在电应力下老化 7040 小时的固有电容、工作电压、波长和亮度变化。我们使用一个简单的设置来监控带有 CMOS 相机的测试设备的光强度变化。在纯电应力下，主波长略微红移 3.29 nm，OLED 的阈值电压从 4.2 V 增加到 5.25 V，亮度随应力时间衰减至初始亮度的 88%，而光谱形状为不受影响。