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Decreasing Density of Grown-in Dislocations in AlN/c-Sapphire Templates Grown by Plasma-Activated Molecular Beam Epitaxy
Technical Physics Letters ( IF 0.8 ) Pub Date : 2020-06-05 , DOI: 10.1134/s1063785020040240 V. V. Ratnikov , D. V. Nechaev , A. V. Myasoedov , O. A. Koshelev , V. N. Zhmerik
中文翻译:
等离子体激活分子束外延生长的AlN / c-蓝宝石模板中的成位错的密度降低
更新日期:2020-06-05
Technical Physics Letters ( IF 0.8 ) Pub Date : 2020-06-05 , DOI: 10.1134/s1063785020040240 V. V. Ratnikov , D. V. Nechaev , A. V. Myasoedov , O. A. Koshelev , V. N. Zhmerik
Abstract
AlN/c-sapphire templates grown by plasma-activated molecular beam epitaxy have been studied using multicrystal X-ray diffractometry and a multi-beam optical stress meter system. Studies of the seed and buffer layers grown at different ratios of Al and N* growth flows and substrate temperatures have shown that templates with small tensile elastic stresses (<0.5 GPa) and densities of screw and edge grown-in dislocations 4 × 108 and 8 × 109 cm−2, respectively, can be produced.中文翻译:
等离子体激活分子束外延生长的AlN / c-蓝宝石模板中的成位错的密度降低