Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ( IF 1.5 ) Pub Date : 2020-05-30 , DOI: 10.1016/j.nima.2020.164203 Alexei Ulyanov , David Murphy , Joseph Mangan , Viyas Gupta , Wojciech Hajdas , Daithi de Faoite , Brian Shortt , Lorraine Hanlon , Sheila McBreen
Radiation damage of J-series silicon photomultipliers (SiPMs) has been studied in the context of using these photodetectors in future space-borne scintillation detectors. Several SiPM samples were exposed to 101.4 MeV protons, with 1 MeV neutron equivalent fluence ranging from n/cm to n/cm. After the irradiation, the SiPMs experienced a large increase in the dark current and noise, which may pose problems for long-running space missions in terms of power consumption, thermal control and detection of low-energy events. Measurements performed with a CeBr3 scintillator crystal showed that after exposure to n/cm and following room-temperature annealing, the dark noise of a single 6 mm square SiPM at room temperature increased from 0.1 keV to 2 keV. Because of the large SiPM noise, the gamma-ray detection threshold increased to approximately 20 keV for a CeBr3 detector using a 4-SiPM array and 40 keV for a detector using a 16-SiPM array. Only a small effect of the proton irradiation on the average detector signal was observed, suggesting no or little change to the SiPM gain and photon detection efficiency.
中文翻译:
使用101.4 MeV质子的SensL J系列硅光电倍增管的辐射损伤研究
在未来的星载闪烁探测器中使用这些光电探测器的背景下,已经研究了J系列硅光电倍增管(SiPM)的辐射损伤。几个SiPM样品暴露于101.4 MeV质子中,其中1 MeV中子等效注量范围为 ñ/厘米 至 ñ/厘米。辐照后,SiPM的暗电流和噪声大大增加,这可能对长时间运行的太空飞行任务造成功耗,热控制和低能事件检测方面的问题。用CeBr3闪烁晶体进行的测量表明,暴露于 ñ/厘米室温退火后,单个6 mm见方的SiPM的暗噪声在室温下从0.1 keV增加到2 keV。由于SiPM噪声大,对于使用4-SiPM阵列的CeBr3检测器,伽马射线检测阈值增加到大约20 keV,对于使用16-SiPM阵列的检测器,伽马射线检测阈值增加到40 keV。观察到质子辐照对平均检测器信号的影响很小,这表明SiPM增益和光子检测效率没有变化或几乎没有变化。