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Ionizing radiation in electronics from the Compton scattering of quasi-stationary particles generated by characteristic and Bremsstrahlung x rays
Aip Advances ( IF 1.4 ) Pub Date : 2020-05-07 , DOI: 10.1063/5.0006618
Sun-Hong Min 1, 2 , Ohjoon Kwon 3 , Matlabjon Sattorov 2, 4 , Seontae Kim 2 , Dongpyo Hong 2 , Seonmyeong Kim 2 , Ilsung Cho 1 , Chawon Park 1 , Wongyun Jung 1 , Minho Kim 1 , Kyeong Min Kim 1 , Won Taek Hwang 1 , Seungwoo Park 1 , Kyo Chul Lee 1 , Yong Jin Lee 1 , Sang Moo Lim 1 , Bong Hwan Hong 1 , Gun-Sik Park 2, 4
Affiliation  

Characteristic x rays generated by a collision between a tungsten target and relativistic electron beams generated from a compact electrostatic accelerator based on a Marx generator and a Blumlein pulse-forming line can induce transient ionizing radiation in electronics. While the decelerated electron beam is close to a collector out of range of an external magnetic field, Bremsstrahlung x rays occur at the same time. Compton scattering also occurs through secondary reaction interactions with quasi-stationary particles such as ejected inner shell electrons or photons. During a simulation, a semiconductor process is used to analyze the effects and processes of photocurrents derived from the flow of the drain current when transient pulses generated from the compact electrostatic accelerator are incident in the pMOSFET-AD420-based detector. The photocurrent induced from the detector is also measured by experimental results in comparison with a computer simulation, and a photocurrent detection experiment was then conducted with a high-pulse-current compact electrostatic accelerator. In addition, data pertaining to the irradiation dose rate and photon emission rate were obtained. In order to confirm the radiation pattern in the situation of Compton scattering, the ionizing radiation effect in the photosensitive phosphor was identified using a fluorescent lamp. During the experiment, a relativistic electron beam operating at high energy and current levels at a maximum of 1MeV-10 kA was utilized.

中文翻译:

由特征和Bre致辐射x射线产生的准平稳粒子的康普顿散射使电子学中的电离辐射

钨靶与由基于Marx发生器和Blumlein脉冲形成线的紧凑型静电加速器所产生的相对论电子束之间的碰撞所产生的特征X射线会在电子设备中引起瞬时电离辐射。当减速的电子束接近外部磁场范围之外的集电极时,同时发生stra致辐射x射线。康普顿散射还通过与准静态粒子(例如内壳电子或光子)的二次反应相互作用而发生。在仿真过程中,当紧凑型静电加速器产生的瞬态脉冲入射到基于pMOSFET-AD420的检测器中时,将使用半导体工艺来分析由漏极电流流动产生的光电流的影响和过程。与计算机模拟相比较,还通过实验结果测量了从检测器感应出的光电流,然后使用高脉冲电流紧凑型静电加速器进行了光电流检测实验。另外,获得了与照射剂量率和光子发射率有关的数据。为了确认康普顿散射情况下的辐射图,使用荧光灯确定了感光性磷光体中的电离辐射效应。在实验过程中,使用了相对论电子束,该电子束在高能量和最大1MeV-10 kA的电流水平下工作。然后用高脉冲电流紧凑型静电加速器进行光电流检测实验。另外,获得了与照射剂量率和光子发射率有关的数据。为了确认康普顿散射情况下的辐射图,使用荧光灯确定了感光性磷光体中的电离辐射效应。在实验过程中,使用了相对论电子束,该电子束在高能量和最大1MeV-10 kA的电流水平下工作。然后用高脉冲电流紧凑型静电加速器进行光电流检测实验。另外,获得了与照射剂量率和光子发射率有关的数据。为了确认康普顿散射情况下的辐射图,使用荧光灯确定了感光性磷光体中的电离辐射效应。在实验过程中,使用了相对论电子束,该电子束在高能量和最大1MeV-10 kA的电流水平下工作。用荧光灯鉴定光敏荧光粉中的电离辐射效应。在实验过程中,使用了相对论电子束,该电子束在高能量和最大1MeV-10 kA的电流水平下工作。用荧光灯鉴定光敏荧光粉中的电离辐射效应。在实验过程中,使用了相对论电子束,该电子束在高能量和最大1MeV-10 kA的电流水平下工作。
更新日期:2020-05-07
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