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Precise structural analysis of polymer materials using synchrotron X-ray scattering and spectroscopic methods
Polymer Journal ( IF 2.3 ) Pub Date : 2020-05-28 , DOI: 10.1038/s41428-020-0357-2
Ryohei Ishige

Polymers can exist in many different conformations and exhibit a variety of unique and complicated hierarchical structures, which are dominated mainly by entropy and sometimes by kinetics rather than thermodynamics due to the intrinsic high viscosity, polydispersity, and so on. The physical properties of polymeric materials are determined not only by their primary structures but also by their higher order (hierarchical) structures. Hence, precise determination of the structures at all spatial scales is essential to control the physical properties of polymeric materials. This focus review details the use of various characterization techniques, including variable-temperature (VT) synchrotron (SR) X-ray scattering, VT SR X-ray diffraction, and infrared p-polarized multiple-angle incidence resolution spectrometry (pMAIRS), to determine the structure of fully liquid-crystalline ABA-type triblock copolymers, highly crystalline aromatic polyimides, and thin-film polyimides, respectively. The advantages of these methods are briefly reviewed, and the relationship between the macroscopic physical properties and the inherent microstructure is discussed. Physical properties of polymer materials are deeply related to not only the primary structure but also the higher ordered structure such as periodic structures and molecular orientation. If the target material consists of ordered and non-ordered region, the former structure can be selectively detected by X-ray scattering method, whereas structural information of both the regions is obtained by infrared absorption spectroscopy. Particularly for thin film materials, infrared pMAIRS (p-polarized multiple-angle incidence resolution spectroscopy) and GI-XRD (grazing incidence X-ray diffraction methods are very useful for precise structural analyses.

中文翻译:

使用同步加速器 X 射线散射和光谱方法对聚合物材料进行精确结构分析

聚合物可以以多种不同的构象存在,并表现出各种独特而复杂的层次结构,由于固有的高粘度、多分散性等,这些结构主要受熵支配,有时受动力学而非热力学支配。聚合物材料的物理性质不仅取决于它们的初级结构,还取决于它们的高阶(分级)结构。因此,在所有空间尺度上精确确定结构对于控制聚合物材料的物理性质至关重要。这篇重点综述详细介绍了各种表征技术的使用,包括变温 (VT) 同步加速器 (SR) X 射线散射、VT SR X 射线衍射和红外 p 偏振多角入射分辨率光谱法 (pMAIRS),分别确定全液晶 ABA 型三嵌段共聚物、高度结晶的芳香族聚酰亚胺和薄膜聚酰亚胺的结构。简要回顾了这些方法的优点,并讨论了宏观物理性质与固有微观结构之间的关系。高分子材料的物理性能不仅与一级结构密切相关,而且与周期结构、分子取向等更高阶结构密切相关。如果目标材料由有序和非有序区域组成,前一种结构可以通过X射线散射方法选择性检测,而这两个区域的结构信息都是通过红外吸收光谱获得的。特别是对于薄膜材料,
更新日期:2020-05-28
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