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High-aspect ratio probes with selected geometry for advanced MFM measurements
Ferroelectrics ( IF 0.6 ) Pub Date : 2020-05-18 , DOI: 10.1080/00150193.2020.1722892
M. V. Zhukov 1, 2 , K. I. Belousov 2, 3 , I. D. Sapozhnikov 1 , A. O. Golubok 1, 2
Affiliation  

Abstract Probes with high aspect ratio Pt/C nanowhiskers on the tops of Si cantilevers coated with a thin magnetic layer were fabricated. A simulation of the magnetic field strength gradient in the interaction of single magnetic domains with probes of various shapes is carried out. The optimal parameters of magnetic field detection were found, such as the probe geometry, material and thickness of the magnetic coating. The quality of domain visualization in the phase contrast mode for both types of probes was compared. An improvement of phase contrast with nanowhiskers probes was confirmed by consistent experimental and simulation data.

中文翻译:

具有选定几何形状的高纵横比探头,用于高级 MFM 测量

摘要 在涂有薄磁性层的 Si 悬臂梁顶部制造了具有高纵横比 Pt/C 纳米晶须的探针。对单个磁畴与各种形状的探针相互作用时的磁场强度梯度进行了模拟。找到了磁场检测的最佳参数,如探头几何形状、磁性涂层材料和厚度。比较了两种类型探针在相位对比模式下的域可视化质量。一致的实验和模拟数据证实了纳米晶须探针相衬的改善。
更新日期:2020-05-18
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