X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.

中文翻译：

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XPEEM 设置中的相干 X 射线散射

X 射线光电子显微镜是同步加速器中最成功的成像工具之一，已知其在外场应用和短电子平均自由程方面存在局限性。为了克服这些问题，我们采用现有的 XPEEM 仪器在反射率模式下同时执行相干 X 射线散射测量，从而为 XPEEM 添加了一种补充方法。光子输入光子输出 X 射线散射提供了对掩埋界面的敏感性以及在外部场下工作的可能性，这在使用带电粒子进行成像时具有挑战性。反过来，XPEEM 大大减轻了与相干衍射成像中使用的重建方法相关的困难。