Additive manufactured (AM) lattice structures have become very prominent in recent times especially in air and spacecraft industry for their lower weight and specific mechanical properties. Their stiffness and strength can be controlled by their geometrical properties, such as the shape and dimensions of the unit cell. Geometrical and dimensional accuracy of the AM lattices is therefore one of the most important requirements to meet the desired functionality as there could be significant deviations in the as-produced part from the designed model; thus, their measurements are of great significance. X-ray computed tomography (CT) has emerged as a promising solution in the field of industrial quality control over the last few years due to its non-destructive approach. However, CT measurement accuracy depends on various parameters (part material, system, operator, environment, data post-processing), among which the resolution or voxel size of the CT data is crucial. In this work, the influence of resolution on the measurement of metallic lattice structure is studied by means of simulations and real CT experiments. The optimized CT acquisition settings are obtained with the help of simulated radiographs and design-of-experiment approach. Three different resolutions are achieved by placing the part at different positions from the X-ray source. The computer-aided design (CAD) model comparison reveals that the majority of surface has a deviation of ± 0.2 mm and the results are slightly affected by the resolution. The wall thickness analysis provides a global observation of the strut and node thicknesses. Individual struts are measured with representative regions of interest (ROIs) considering the manufacturing direction. The measurement results are significantly affected by the resolution (or voxel size) of the CT data. Simulated CT scans with different resolutions have been performed for systematic error estimation in relation to the voxel size.

中文翻译：

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分辨率对金属AM晶格结构基于X射线CT的测量的影响

增材制造的（AM）晶格结构最近以其较低的重量和特定的机械性能而变得非常重要，尤其是在航空航天工业中。它们的刚度和强度可以通过它们的几何特性来控制，例如，晶胞的形状和尺寸。因此，AM晶格的几何和尺寸精度是满足所需功能的最重要要求之一，因为所生产的零件可能会与设计模型产生明显差异。因此，它们的测量意义重大。X射线计算机断层摄影（CT）由于其非破坏性方法，在过去几年中已成为工业质量控制领域中的一个有前途的解决方案。但是，CT测量精度取决于各种参数（零件材料，系统，操作员，环境，数据后处理），其中CT数据的分辨率或体素大小至关重要。在这项工作中，通过模拟和真实的CT实验研究了分辨率对金属晶格结构测量的影响。优化的CT采集设置是借助模拟X射线照片和实验设计方法获得的。通过将零件放置在与X射线源不同的位置，可以实现三种不同的分辨率。计算机辅助设计（CAD）模型的比较表明，大多数表面的偏差为±0.2 mm，结果受分辨率的影响很小。壁厚分析提供了对支柱和节点厚度的整体观察。考虑到制造方向，使用具有代表性的感兴趣区域（ROI）来测量各个支撑杆。CT数据的分辨率（或体素大小）会显着影响测量结果。已经执行了具有不同分辨率的模拟CT扫描，以进行有关体素大小的系统误差估计。