Abstract Over the last decades, the connection of photovoltaic (PV) plants into the grid has increased. In this context, the analysis of the PV inverter reliability became a target of study for many researchers in the area. The solar irradiance and ambient temperature mission profiles are highly used in the literature to perform the PV inverter lifetime evaluation. However, the choice of the mission profile resolution is not straightforward. The increasing of the mission profile sampling time can reduce the consumed simulation time during the lifetime evaluation process. Nevertheless, the evaluation accuracy decreases. Therefore, this work analyzes the effect of the mission profile resolution for the semiconductor devices and the electrolytic capacitors, separately. A maximum allowed error equals 10% in the obtained lifetime consumption is assumed. For the case study analyzed in this work, the total processing time was reduced in 27.91% for a lifetime evaluation error lower than 9%.

中文翻译：

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追求计算高效的光伏逆变器磨损预测：任务剖面分辨率的作用

摘要 在过去的几十年中，光伏 (PV) 电站与电网的连接有所增加。在此背景下，光伏逆变器可靠性分析成为该领域众多研究人员的研究目标。太阳辐照度和环境温度任务曲线在文献中被广泛用于执行光伏逆变器寿命评估。然而，任务剖面分辨率的选择并不简单。任务剖面采样时间的增加可以减少生命周期评估过程中消耗的仿真时间。然而，评估精度下降。因此，这项工作分别分析了半导体器件和电解电容器的任务剖面分辨率的影响。假定最大允许误差等于获得的寿命消耗的 10%。